The NexION 5000 Cleanroom ICP-MS is suitable for cleanroom applications, designed specifically for those requiring the highest level of cleanliness and the lowest background equivalent concentrations (<1 ppt, even in hot plasma). It is equipped with a host of new and proprietary technologies which together surpass traditional triple-quad capabilities and redefine your expectations:
深度 | 85.0 cm |
---|---|
高度 | 85.0 cm |
型号名称 | NexION 5000 Cleanroom ICP-MS |
产品品牌名称 | NexION |
技术类型 | Multi-Quad ICP-MS for Cleanroom Applications |
重量 | 191.0 kg |
宽度 | 114.0 cm |
As semiconductor devices have become smaller and more sophisticated, it has become essential to prevent metal contamination, which causes yield loss. Therefore, strict impurity control is required for chemicals used in the fabrication process.
In partnership with Elemental Scientific Inc. (ESI), we’re delighted to bring to you a collection of application briefs for the fully-automated analysis of a variety of semiconductor-grade chemicals, seamlessly coupling the ESI prepFAST S ultraclean ...
Article by Kieran Evans on researching and designing better batteries with the help of ICP-OES, ICP-MS, and FTIR Analytical methods in a laboratory setting
The NexION® 5000 multi-quadrupole ICP-MS won an R&D 100 Award, recognizing it as, “One of the 100 most technologically significant new products of the year in the analytical/test category.”
质量控制监控和测试是确保棕榈油质量的重要环节。质量控制参数用于判断棕榈油产品的质量,并可对其进行监控和测试,以确保棕榈油没有故意或意外掺假。
Welcome to the application digest for PerkinElmer’s NexION® 5000 Multi-Quadrupole ICP-MS. The multi-award-winning NexION 5000 is the industry’s first and only four-quadrupole ICP-MS system, engineered to remove the most complex interferences and address the most challenging applications requiring ul ...
Laboratories conducting trace-elemental analyses require high-performance instrumentation capable of delivering accurate and reproducible results, even at low concentrations. Find out how recent developments in multi-quadrupole ICP-MS technology address these evolving needs. Advantages: superior int ...
This nanometrology portfolio infographic poster gives you a 1-page overview of the instrumentation required by laboratories for the investigation of nanomaterials which are used to develop advanced materials in a range of applications.
We are supporting scientists as they work to solve the battery challenges that will drive the next phases of global economic advancement as the world pivots towards a renewable energy future.
PerkinElmer’s All Matrix Solution, available on all NexION® ICP-MS instruments, allows online gas dilution of your samples, both improving efficiency and preventing contamination.
Syngistix™ for ICP-MS software for the NexION® ICP-MS series instruments is designed with your workflow in mind to make it easy for you to set up and report your analyses, upleveling your experience.
PerkinElmer is empowering sustainability for a range of global industries including renewable energy, batteries and energy storage.
Take a look at the exciting initiative that Colorado State University is leading: The Periodic Table of Food database.
In this on-demand presentation video, Jess Liu of NewFast Technology talks about trace contaminant detection in chip (silicon wafer) manufacturing.
In this webinar we will examine the power of PerkinElmer's latest in the NexION Series of ICP-MS: the NexION 5000 multi-quadrupole ICP-MS.
Our atomic spectroscopy experts have complied a series of Atomic Spectroscopy Webinars to walk through the fundamentals and theory of AA, ICP-OES and ICP-MS analysis.
With the increasing demand for high-specification electronic devices, the discovery of rare earth elements (REEs) has become crucial.
Rechargeable high-performance battery technology is enabling the large-scale e-mobility revolution.
In semiconductor fabrication, it is imperative to be able to control impurities in specialty gases, as otherwise they will lead to unwanted formation of deposits on the wafer surface
We all know Chips are essential for a host of day to day products which need memory and operating semiconducting chips in their manufacture - from phones to cars, to commercial and industrial equipment.
Disruptions in ocean chemistry can lead to algal blooms which can pose a risk to wildlife.
Syngistix™ software for NexION® ICP-MS instruments provides several different ways of data acquisition, depending on analysis needs and desirable results.
Syngistix™ software for NexION® ICP-MS instruments provides several different ways of data acquisition, depending on analysis needs and desirable results.
在快节奏的分析界,为了保证质量和安全,检测结果的准确性和可重现性至关重要。业内的诸多使用者对检测设备有着共同的需求,期望在分析微量元素的同时可以去除干扰、提供非常低的检出限和出色的背景等效浓度 (BECs)。
这正是NexION® 5000背后的设计理念,为业内提供与众不同的化学高分辨多重四极杆ICP-MS。这个系统能够提供优于高分辨率ICP-MS和传统的三重四极杆技术。
领略NexION® 5000 ICP-MS的独特之处,欢迎下载相关资料。
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In the fast-paced analytical world, accurate and reproducible results are essential to guaranteeing quality and ensuring safety. What many industries have in common is the need for trace-element analysis with superior interference removal, extremely low detection limits, and outstanding background e ...
As the fundamental need to safeguard our environment continues to grow, and economic demand increases to support our growing population, it’s important to explore more sustainable avenues to ensure the long-term health of our planet at the same time as encouraging business and economic growth. Perki ...
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As the world moves to embrace renewable energy sources and reduce our global CO2 emissions, it will also be more dependent than ever on better battery technology, powering the demands of industries such as automotive, energy storage, and portable consumer goods like power tools, computers, and phone ...
This brochure guides you through all our PerkinElmer analytical solutions for the automotive industry. From advanced polymers and rubber materials, to batteries, semiconductors, glass, fuels and lubricants. See how we can offer you fully-rounded laboratory solutions along the whole automotive value ...
Syngistix™ for ICP-MS software for the NexION® ICP-MS instruments is designed to improve efficiencies in the laboratory. It features a refreshed user interface that conforms to your workflow, delivering a modern, streamlined experience based on familiar left-to-right navigation and a ribbon menu, wi ...
The NexION® 5000 is a multi-quadrupole-based ICP-MS instrument engineered to remove the most complex interferences, ideal for multi-element analysis applications requiring ultra-trace-level detection. Download this product note to discover all of its innovative features.
Download this Flyer for an overview of PerkinElmer's analytical solutions for the Semiconductor industry. This 2-page flyer outlines semiconductor and microelectronic workflows and applications, and the precise and reliable PerkinElmer solutions to address them - including instrumentation, consumabl ...
Today’s sustainable solutions are opening exciting new ways for businesses to fuel economic growth, while minimizing adverse impact on people and the planet. Laboratories are also working sustainability into their business plans to reduce downtime, waste, and costs – and in many cases, improve their ...
Download this useful flyer for a summary of how our instrumentation can test for safety, performance and composition of your advanced battery materials. Get an overview of solutions and their benefits in materials characterization techniques from FT-IR, ICP-OES, ICP-MS, DSC, TGA, GC-MS and hyphenate ...
Product Certificate for the Nexion 5000
Fine and specialized chemicals are used throughout the manufacturing process of semiconductor and electronic products, requiring strict control of impurities. Among these impurities, contaminants of inorganic nature can adversely affect device performance and impact the yield of the fabrication proc ...
For decades, the semiconductor industry has been designing new devices that are smaller, faster and consume less power than their predecessors. To maintain this trend, the critical features of these devices must also become smaller and have fewer defects. The small diameter of a chip’s features requ ...
In today’s fast-paced world, semiconductors have become indispensable. Demands for faster and smaller chips with higher integration and lower energy consumption are increasing. Potential sources of metallic contamination in semiconductor manufacturing processes are ubiquitous, thus it is critical to ...
Silicon (Si) is the most used semiconductor and is a critical element for producing circuits found in everyday electronics. As more industries utilize semiconductor devices and Si wafers in electronic products and services, there is an increasing demand for Si wafers with minimal impurities due to t ...
Semiconductor device fabrication utilizes a variety of chemicals, whose metallic impurity levels must remain at ultra-trace levels to ensure end product quality. Inductively coupled plasma mass spectrometry (ICP-MS) is one of the most sensitive techniques for metallic impurities testing and has beco ...
Metallic contamination in semiconductor products adversely affects device performance and impacts the yield of the fabrication process. To meet the demand for higher yields and performance in wafer substrates, contamination must be minimized on the wafer surface as well as in the substrate itself. T ...
During the production of semiconductor devices, it is crucial to ensure that the silicon wafers are free of contaminants and impurities. The use of high-purity chemicals during the cleaning process is critical to the semiconductor product’s overall quality and performance. Therefore, it is essential ...
Inductively coupled plasma mass spectrometry (ICP-MS) is an indispensable analytical tool in the semiconductor industry, since one of the most sensitive techniques for analyzing metallic impurities in chemicals. Most chemicals are analyzed with minimum dilution to determine ultra-trace levels of met ...
Contaminants in chemicals used during manufacturing processes have a direct impact on product yield and reliability of semiconductor devices. Within the whole process of integrated circuit manufacturing, wafers are sent for repeated cleaning using hydrogen peroxide (H2O2). Semiconductor Equipment an ...
The production of electronic devices is a complex process that requires the use of ultra-pure chemicals during the manufacturing steps. High-purity-grade sulfuric acid (H2SO4) is generally used for cleaning components and etching all metal and organic impurities on silicon wafers. Impurities in sulf ...
Uranium-236 (236U) is the product of thermal neutron capture of 235U, but the natural occurrence of 236U is very rare. The presence of this isotope in a sample of uranium indicates that the sample originates from a nuclear reactor. Compared to naturally occurring uranium isotopes like 234U and 235U, ...
The most commonly used organic chemicals in integrated circuit (IC) fabrication are isopropyl alcohol (IPA), propylene glycol methyl ether acetate (PGMEA), propylene glycol methyl ether (PGME), and n-methyl pyrrolidone (NMP). These solvents can leave behind organic film residues with metallic and no ...
电感耦合等离子体质谱仪(ICP-MS)一直是分析尿液、血液、血清、唾液等体液以及各类组织中各种痕量元素(如铅Pb、砷As、汞Hg和铜Cu)的工具选择。随着骨科植入物的使用越来越多,钛(Ti)和钴(Co)等元素也被添加到常见测试分析物列表中。
在此,我们将展示出珀金埃尔默最新的化学高分辨多重四极杆ICP-MS仪器NexION 5000总结了血液分析的结果,以三种不同含量(正常、升高和较高)的血液标准物质ClinChek® 进行分析,展示了出色的准确性、稳定性和丰度灵敏度能力。
超纯水(UPW)被广泛地用于半导体器件生产中所有湿法工艺步骤,包括晶片冲洗和化学浴中化合物的稀释。在这些关键步骤中,可能会吸收来自化学浴和冲洗水中的污染物,然后通过一系列的化学和电化学反应沉淀到硅表面。在成品的重点区域中,如果金属污染物的浓度达到50 ppq,就会改变集成电路部件的电气参数,导致其无法通过最后的电气测试。因此超纯水纯度测定至关重要。 在此,我们将展示出珀金埃尔默最新的化学高分辨多重四极杆ICP-MS仪器NexION 5000获得的超纯水分析结果。NexION 5000 四组四极杆组成的多重四极杆ICP-MS质谱平台,通过各四极杆的不同质量分辨能力和工作模式,结合碰撞反应池技术, ...
Since ultrapure water (UPW) is used throughout the semiconductor industry in a variety of applications, impurities need to be controlled as these will directly impact the quality and overall yield of semiconductor products. ICP-MS is often used to accurately quantify sub-ppt concentrations of impuri ...
Sulfuric acid (H2SO4) is used in the semiconductor industry to clean, etch impurities on silicon wafers and strip photoresist during the chip production processes. The reduction of potential contamination on silicon wafers is crucial, as trace-metal, particulate, and organic contaminants can alter t ...
Nitric acid (HNO3) is widely utilized in the semiconductor industry during the cleaning process of silicon wafers to reduce contamination by trace metals, particulates, and organic contaminants which would otherwise alter the functionality of the semiconductors. As such, the use of a high-quality ac ...
As semiconductor manufacturing processes are being performed at increasing micro-levels, the demand for ICP-MS instrumentation capable of analyzing non-metallic elements at ultra-trace concentrations has grown. For these applications, the use of an ICP-MS system with a full-length resolving quadrupo ...
Nitric acid is widely used throughout the semiconductor and electronics industry. Various purity grades are required depending on the application and the intended use. For this reason, the semiconductor industry has required ever-lower detection of a broad range of impurities, including non-metallic ...
Tetramethylammonium hydroxide (TMAH) is a basic solvent widely utilized in the semiconductor industry for photoresist development and lithography applications. The reduction of potential contamination on silicon wafers during the manufacturing processes is crucial as trace-metal, particulate and org ...
具有OmniRing的第二代三锥接口的新型设计专为NexION 5000 ICP-MS而研发,兼顾了灵敏度和稳定性。该设计以三锥接口几何 结构为基础,基于简单高效的OmniRing技术提供了独特的应对空 间电荷效应的解决方案。该设计从ICP-MS理想接口的诸多特性着 手,通过减少离子流提高了传输效率,与此同时,还以受控的方式 实现了离子通过接口后的加速,而不会将高能离子传输到下游离子 光学系统中。结果是在没有提高仪器本底水平的情况下,大大提高 了分析物的信号强度。通过这种新型接口设计,能够在强健等离子 体条件下,直接以亚ppt级的背景等效浓度对复杂基质进行分析。 除了提高灵敏度,该接口设计还使 ...
在用珀金埃尔默NexION系列ICP-MS对高基体样品进行分析时,配合AMS系统可以给您 带来一系列好处。 通过将氩气通入雾室颈部,样品气溶胶得到稀释,可以获得更高的离子化效率、更小的基体效应和更少的锥口沉积,使样 品前处理更为简单,分析数据质量更高。
The NexION® 5000 ICP-MS, with multi-quadrupole technology and Universal Cell, is able to take full advantage of element reactivity with 100% pure gases by analyzing them as cluster ions at higher masses where no interferences reside, and the background is clean. The Universal Cell, thanks to its qua ...
Unlike other ICP-MS systems on the market that utilize conventional 40-MHz or 27-MHz commercially available generators which are typically customized and modified to work with ICP-MS instruments, the NexION® 1000/2200/5000 ICP-MS systems feature a 34-MHz frequency free-running RF generator, which wa ...
Interferences will always occur in ICP-MS and need to be dealt with. However, the NexION® 5000 multi-quadrupole ICP-MS with quadrupole Universal Cell is able to effectively and reproducibly remove spectral interferences leading to improved accuracy, repeatability and reproducibility, while solving p ...
TotalQuant, a software feature unique to PerkinElmer's NexION® ICP-MS systems, intelligently interprets the complete mass spectrum, providing semi-quantitative to quantitative results for all elements. TotalQuant and survey scan can provide supplementary and confirmatory information about unknown sa ...
本指南概述了最常用的原子光谱技术,并提供了所需信息,能够帮助您选择最适合您个人需求的应用。
This document provides information to assist in preparing your laboratory for the PerkinElmer NexION® 5000 ICP-MS system prior to instrument delivery and installation.
Whether looking for sample introduction components or standards, we have the consumables you need to keep your NexION up and running smoothly and efficiently.
This guide offers an overview of analyses required throughout the battery value chain - learn about innovative analytical solutions for testing every part of the battery, including the anode, cathode, binder, separator, and electrolyte. See the value in data generated from a variety of applications ...
Accurate, reproducible trace elemental analysis is essential to ensuring the quality and safety of our products and our environment, and the award-winning NexION® ICP-MS platform delivers that level of accuracy and repeatability through a host of unique features that provide superior interference re ...
Newly regulated industries, such as cannabis, must deal with establishing standardized protocols with the prospect of regulations changing quickly and evolving as the industry expands. When establishing Sigma Analytical Services Inc. in 2017, a new company in a newly regulated industry with the inte ...
As the limits of detection (LODs) for trace metal analysis are increasingly being pushed to the next decimal, a need exists to meet these new detection requirements without compromising accuracy or precision. Inductively coupled plasma mass spectrometry (ICP-MS) is often the technique of choice for ...
Infographic Poster showing the range of different analytical solutions for Toxicology Labs; from GC and LC, to ICP-MS and UV-Vis. Benchtop and floor standing chromatography, spectroscopy and thermal solutions for everyday robust and reliable analyses. FOR RESEARCH USE ONLY. NOT FOR USE IN DIAGNOSTIC ...
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As semiconductor science advances and the wafers become more complex - increasing volumes of water are needed for the production processes. Manufacturers must balance their water consumption with environmental factors and quality in production. This whitepaper examines the trends and innovations in ...