Total Absolute Measurement System (TAMS) | PerkinElmer
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Total Absolute Measurement System (TAMS)

The most flexible platform of its kind, the Total Absolute Measurement System (TAMS) unit allows you to choose the right detector for angular-dependent measurements of optical properties of thin and thick samples, using a concentric rotation stage for sample and detector. Used with the LAMBDA 850+ and 1050+ UV/Vis/NIR spectrometers, the improved TAMS system allows the use of multiple types of detectors depending upon the sample type and application.

货号 L6310240
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详细信息

Whatever detector you choose, TAMS maintains the highest accuracy with the widest wavelength range for angle-dependent measurement. Commonly used in the analysis of glazing found on architectural and automotive glass as well as photovoltaic cells in the solar industry, TAMS is a useful addition to any production lab tasked with the measurement of transmission and absolute reflectance at variable angles.

  • Fully automated goniometer design capable of measuring bi-directional reflectance and transmittance and angular resolved scattering
  • The accessory occupies the detector compartment only
  • Separate detectors for reference and sample beam, both can be exchanged by the operator for other detector modules that are optimized for different applications
  • Angular resolution 0.01° for both sample and detector stages
  • Angular accuracy 0.02° degrees for both sample and detector stages
  • Angular range sample stage +/- 180°
  • Angular range detector stage 15° – 345°
  • Angular range in reflectance 7.5° – >80°, depending on sample size
  • Angular range in transmittance 5° – >80°, depending on sample size (sample – detector inter-reflections occur for angles < 5° that compromises the accuracy)
  • Sample size up to 150 x 150 mm with the standard sample holder (200 mm x 180 mm with other means)
  • 200 mm Rotating sample platform with M5 screw holes on a 25mm x 25mm grid

Applications

  • Absolute measurement of directional Reflectance and transmittance
  • BRDF/ BTDF measurements

Unique flexible detector sets

For each application you can choose the best detector set.

  • Sphere Detectorsets for maximum accuracy (to capture all additional beams from for example thick and slightly curved samples
  • Standard Detectorsets for maximum sensitivity (BRDF/BTDF an scattering measurements)

Autosampler

The TAMS autosampler (fully automated and integrated in TAMS user interface) is capable of performing measurements on a 6 inch wafer at different positions when installed in a TAMS accessory Multisampling is possible by placing a holder for 19 x 1 inch samples or 5 x 2 inch sample. You can also design your own holder into the autosampler.

规格

技术类型 UV/VIS
资源
  • 所有

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