Spotlight 400 FT-IR Imaging System

FT-IR Imaging for Exceptional Analyses

The Spotlight 400 FT-IR Imaging System is designed with state-of-the-art technology to allow for intelligent automation and sophisticated analysis capabilities. The system incorporates a number of unique productivity tools and features an ATR imaging system that enables the collection of high resolution infrared images of extremely small samples to visualize the composition of materials based on FT-IR spectral data.

Unique features of the Spotlight 400 System include:

• High quality spectral production and images from sample areas, yielding pixel resolutions of 6.25, 25, or 50 microns
• Region of Interest (ROI) finding to allow for ease of analysis of multiple particles and layers all at once
• Configurability to be used with extended range mid-IR, near-IR or dual range FT-IR with the Spectrum 3^™ system to give maximum information from samples in the shortest possible time.
• Configurability to be used with mid-IR, near-IR, or dual range FT-IR with the Spectrum 3^™ systems to give maximum information from samples in the shortest possible time.

The Spotlight 400 FT-IR Imaging System can be configured to meet your FT-IR microscopy demands and produce high-quality spectra and FT-IR images from extremely small samples. See the Configurations table below for standard options, and contact a sales representative for more information to customize a system to suit your analysis needs.

• Dual mode single point and MCT array (mercury cadmium telluride) detector standard with InGaAs array option for optimised NIR imaging
• Micro-ATR objective with a choice of a silicon or germanium crystal
• ATR standard spot and large spot imaging objective with a germanium crystal with automatic switching between wide area survey and high definition imaging modes
• Standard motorized stage that can be controlled by a joystick or through Spotlight software
• White light LED illumination for true color display with capabilities for auto-illumination and autofocus modes
• SpectrumIMAGE^™ software as standard enabling full operation and image analysis
• Can be configured as a system with Spectrum 3^™ or purchased as an upgrade package to an existing compatible PerkinElmer FT-IR spectrometer.

A variety of optional accessories and consumables are available for use with the Spotlight systems, such as an infrared polarizer kit, heated stage accessory, crystal compression cells, and a micro-sampling tool kit for ease with sample handling and preparation.

Microscopy for a Variety of Applications

Easy to use, yet exceptionally powerful and versatile, the Spotlight’s flexibility and sensitivity make it a perfect addition to any lab setting, in any discipline. Some of the applications supported by the Spotlight 400 System include:

• Materials Analysis
• Forensics
• Pharmaceuticals
• Biomedical Research
• Academic Research
• Biomaterials

Results Matter

The powerful software suite drives the Spotlight 400 system and can support advanced FT-IR analysis in research and industrial laboratories, always providing optimal results. The software supplied with the system gives you full control over the microscope including the focusing on the sample, illumination, stage position, changing between sampling modes, and manipulating the spectra that you collect. The spectrometers can operate in ratio, single-beam, or interferogram mode. SpectrumIMAGE software enables control over the imaging system with the ability to view sample images with ease in real time. With Spectrum MultiSearch, identification of unknown mixtures is made simple through the use of comparison algorithms allowing for the separation and library matching of up to 10 components.